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SCIENTIFIC AND TECHNICAL AEROSPACE REPORTS

A Biweekly Publication of the National Aeronautics and Space Administration
VOLUME 44, ISSUE 11 - MAY 30, 2006

NASA STAR REPORTS: 05/30/06
Aeronautics

01 Aeronautics (General)

02 Aerodynamics

03 Air Transportation and Safety

04 Aircraft Communications and Navigation

05 Aircraft Design, Testing and Performance

07 Aircraft Propulsion and Power

08 Aircraft Stability and Control

09 Research and Support Facilities (Air)

09 RESEARCH AND SUPPORT FACILITIES (AIR)
Includes airports, runways, hangars, and aircraft repair and overhaul facilities; wind tunnels, water tunnels, and shock tubes; flight simulators; and aircraft engine test stands.

Also includes airport ground equipment and systems.

For airport ground operations see 03 Air Transportation and Safety.

For astronautical facilities see 14 Ground Support Systems and Facilities (Space).


20060013215 Tetra Tech Environmental Management, Inc., Cincinnati, OH, USA

XRF Technologies for Measuring Trace Elements in Soil and Sediment: Rigaku ZSX Mini II XRFAnalyzer. Innovative Technology Verification Report

Apr. 2006; 208 pp.; In English Report No.(s): PB2006-109039; No Copyright; Avail.: CASI: A10, Hardcopy

The Rigaku ZSX Mini II (ZSX Mini II) XRF Services x-ray fluorescence (XRF) analyzer was demonstrated under the U.S. Environmental Protection Agency (EPA) Superfund Innovative Technology Evaluation (SITE) Program. The field portion of the demonstration was conducted in January 2005 at the Kennedy Athletic, Recreational and Social Park (KARS) at Kennedy Space Center on Merritt Island, Florida. The demonstration was designed to collect reliable performance and cost data for the ZSX Mini II analyzer and seven other commercially available XRF instruments for measuring trace elements in soil and sediment. The performance and cost data were evaluated to document the relative performance of each XRF instrument. This innovative technology verification report describes the objectives and the results of that evaluation and serves to verify the performance and cost of the ZSX Mini II analyzer. Separate reports have been prepared for the other XRF instruments that were evaluated as part of the demonstration. The objectives of the evaluation included determining each XRF instrument's accuracy, Precision, sample throughput, tendency for matrix effects. NTIS

Costs; Environmental Cleanup; Soils; X Ray Fluorescence



20060013217 Tetra Tech Environmental Management, Inc., Cincinnati, OH, USA

 
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XRF Technologies for Measuring Trace Elements in Soil and Sediment: Oxford X-Met 3000TX XRF Analyzer. Innovative Technology Verification Report

Apr. 2006; 230 pp.; In English Report No.(s): PB2006-109038; No Copyright; Avail.: CASI: A11, Hardcopy

The Oxford Instruments Analytical, Ltd., (Oxford) X-Met 3000 TX (X-Met) XRF Services x-ray fluorescence (XRF) analyzer was demonstrated under the U.S. Environmental Protection Agency (EPA) Superfund Innovative Technology Evaluation (SITE) Program. The field portion of the demonstration was conducted in January 2005 at the Kennedy Athletic, Recreational and Social Park (KARS) at Kennedy Space Center on Merritt Island, Florida. The demonstration was designed to collect reliable performance and cost data for the X-Met analyzer and seven other commercially available XRF instruments for measuring trace elements in soil and sediment. The performance and cost data were evaluated to document the relative performance of each XRF instrument. This innovative technology verification report describes the objectives and the results of that evaluation and serves to verify the performance and cost of the X-Met analyzer. Separate reports have been prepared for the other XRF instruments that were evaluated as part of the demonstration. The objectives of the evaluation included determining each XRF instrument's accuracy, precision, sample throughput, and tendency for matrix effect. NTIS

Costs; Environmental Cleanup; Soils; Trace Elements; X Ray Fluorescence



20060013229 Tetra Tech Environmental Management, Inc., Cincinnati, OH, USA

XRF Technologies for Measuring Trace Elements in Soil and Sediment: Oxford ED2000 XRF Analyzer. Innovative Technology Verification Report

Apr. 2006; 208 pp.; In English Report No.(s): PB2006-109037; No Copyright; Avail.: CASI: A10, Hardcopy

The Oxford ED2000 x-ray fluorescence (XRF) analyzer was demonstrated under the U.S. Environmental Protection Agency (EPA) Superfund Innovative Technology Evaluation (SITE) Program. The field portion of the demonstration was conducted in January 2005 at the Kennedy Athletic, Recreational and Social Park (KARS) at Kennedy Space Center on Merritt Island, Florida. The demonstration was designed to collect reliable performance and cost data for the ED2000 analyzer and seven other commercially available XRF instruments for measuring trace elements in soil and sediment. The performance and cost data were evaluated to document the relative performance of each XRF instrument. This innovative technology verification report describes the objectives and the results of that evaluation and serves to verify the performance and cost of the ED2000 analyzer. Separate reports have been prepared for the other XRF instruments that were evaluated as part of the demonstration. NTIS

Costs; Environmental Cleanup; Soils; Trace Elements; X Ray Fluorescence



20060013230 Tetra Tech Environmental Management, Inc., Cincinnati, OH, USA

 
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XRF Technologies for Measuring Trace Elements in Soil and Sediment: Niton XLi 700 Series XRFAnalyzer. Innovative Technology Verification Report

Apr. 2006; 212 pp.; In English Report No.(s): PB2006-109035; No Copyright; Avail.: CASI: A10, Hardcopy

The Niton XLi 700 Series (XLi) XRF Services x-ray fluorescence (XRF) analyzer was demonstrated under the U.S. Environmental Protection Agency (EPA) Superfund Innovative Technology Evaluation (SITE) Program. The field portion of the demonstration was conducted in January 2005 at the Kennedy Athletic, Recreational and Social Park (KARS) at Kennedy Space Center on Merritt Island, Florida. The demonstration was designed to collect reliable performance and cost data for the XLi analyzer and seven other commercially available XRF instruments for measuring trace elements in soil and sediment. The performance and cost data were evaluated to document the relative performance of each XRF instrument. This innovative technology verification report describes the objectives and the results of that evaluation and serves to verify the performance and cost of the XLi analyzer. Separate reports have been prepared for the other XRF instruments that were evaluated as part of the demonstration. NTIS

Costs; Environmental Cleanup; Soils; X Ray Fluorescence; X Rays



20060013231 Tetra Tech Environmental Management, Inc., Cincinnati, OH, USA

XRFTechnologies for Measuring Trace Elements in Soil and Sediment: Niton XLt 700 Series XRFAnalyzer. Innovative Technology Verification Report

Apr. 2006; 206 pp.; In English Report No.(s): PB2006-109036; No Copyright; Avail.: CASI: A10, Hardcopy

The Niton XLt 700 Series (XLt) XRF Services x-ray fluorescence (XRF) analyzer was demonstrated under the U.S. Environmental Protection Agency (EPA) Superfund Innovative Technology Evaluation (SITE) Program. The field portion of the demonstration was conducted in January 2005 at the Kennedy Athletic, Recreational and Social Park (KARS) at Kennedy Space Center on Merritt Island, Florida. The demonstration was designed to collect reliable performance and cost data for the XLt analyzer and seven other commercially available XRF instruments for measuring trace elements in soil and sediment. The performance and cost data were evaluated to document the relative performance of each XRF instrument. This innovative technology verification report describes the objectives and the results of that evaluation and serves to verify the performance and cost of the XLt analyzer. Separate reports have been prepared for the other XRF instruments that were evaluated as part of the demonstration. NTIS

Costs; Environmental Cleanup; Soils; X Ray Fluorescence



20060013234 Tetra Tech Environmental Management, Inc., Cincinnati, OH, USA

XRF Technologies for Measuring Trace Elements in Soil and Sediment: Innov-X XT400 Series XRF Analyzer. Innovative Technology Verification Report

Apr. 2006; 216 pp.; In English Report No.(s): PB2006-109034; No Copyright; Avail.: CASI: A10, Hardcopy

The Innov-X XT400 Series (XT400) x-ray fluorescence (XRF) analyzer was demonstrated under the U.S. Environmental Protection Agency (EPA) Superfund Innovative Technology Evaluation (SITE) Program. The field portion of the demonstration was conducted in January 2005 at the Kennedy Athletic, Recreational and Social Park (KARS) at Kennedy Space Center on Merritt Island, Florida. The demonstration was designed to collect reliable performance and cost data for the XT400 analyzer and seven other commercially available XRF instruments for measuring trace elements in soil and sediment. The performance and cost data were evaluated to document the relative performance of each XRF instrument. NTIS

Costs; Environmental Cleanup; Soils; X Ray Fluorescence



20060013259 Tetra Tech Environmental Management, Inc., Cincinnati, OH, USA

XRF Technologies for Measuring Trace Elements in Soil and Sediment: Rontec PicoTAX XRF Analyzer. Innovative Technology Verification Report

Apr. 2006; 212 pp.; In English Report No.(s): PB2006-109040; No Copyright; Avail.: CASI: A10, Hardcopy

The Rontec PicoTAX x-ray fluorescence (XRF) analyzer was demonstrated under the U.S. Environmental Protection Agency (EPA) Superfund Innovative Technology Evaluation (SITE) Program. The field portion of the demonstration was conducted in January 2005 at the Kennedy Athletic, Recreational and Social Park (KARS) at Kennedy Space Center on Merritt Island, Florida. The demonstration was designed to collect reliable performance and cost data for the PicoTAX analyzer and seven other commercially available XRF instruments for measuring trace elements in soil and sediment. The performance and cost data were evaluated to document the relative performance of each XRF instrument. This innovative technology verification report describes the objectives and the results of that evaluation and serves to verify the performance and cost of the PicoTAX analyzer. Separate reports have been prepared for the other XRF instruments that were evaluated as part of the demonstration. The objectives of the evaluation included determining each XRF instrument's accuracy, precision, sample throughput, and tendency for matrix effects. NTIS

Costs; Environmental Cleanup; Soils; X Ray Fluorescence

Source: NASA


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