IPC TM-650 2.1.1.2 Microsectioning-Semi or Automatic Technique Microsection Equipment (Alternate)
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IPC TM-650 2.1.1.2 Document Information:
Title
Microsectioning-Semi or Automatic Technique Microsection Equipment (Alternate)
IPC-Association Connecting Electronics Industries
Publication Date:
May 1, 2004
Scope:
This procedure is an alternate method for preparing multiple metallographic specimen(s) using microsection equipment. The specimen(s) is(are) for evaluation for quality of the laminate system, plated-through holes (PTHs), the copper foils, platings, and/or coatings. The same basic procedure may be used for examination of other areas on the product.
Note: This microsection technique is a process and not a test method.
Note: SAFETY The use of the materials listed in Section 4 may be limited or forbidden in some environments. Please review the Material Safety Data Sheet (MSDS) for the materials being used.
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