ECA EIA/ECA-469-D Standard Test Method for Destructive Physical Analysis (DPA) of Ceramic Monolithic Capacitors
 |
| Purchase Information |
| Use this form to request purchase information on ECA online subscriptions. |
|
 |
Document ECA EIA/ECA-469-D is offered by IHS as part of an online subscription. This subscription contains many documents on the same topic.
You may also purchase this document alone from the IHS Standards Store.
ECA EIA/ECA-469-D Document Information:
Title
Standard Test Method for Destructive Physical Analysis (DPA) of Ceramic Monolithic Capacitors
Electronic Components, Assemblies & Materials Association
Publication Date:
Apr 1, 2006
Scope:
This document provides terminology, methods, and criteria for characterizing the internal structural features of monolithic, ceramic dielectric capacitors. Its major objective is the accurate evaluation of the internal physical quality of the chip capacitor element as it relates to the functional reliability of the finished capacitor. This Standard also provides needed and useful information pertaining to activities associated with destructive physical analysis (DPA), such as post-decapsulation visual inspection and DPA reporting. In addition, it provides tutorial help for problems inherent in DPA sample processing.
About IHS
IHS (NYSE: IHS) is a leading global provider of critical technical information, decision-support tools and related services in a number of industries including aerospace and defense, automotive, construction, electronics, and energy. IHS serves customers ranging from large governments and multinational corporations to smaller companies and technical professionals in more than 100 countries. IHS been in business for more than 45 years and employ more than 2,300 people around the world.